Gábor Farkas received his MSc degree in electrical engineering in 1976 and the Ph.D. degree in 1981 at the Technical University of Budapest (TUB, now BUTE), Hungary. His first research area was computer aided recognition of circuit topologies, development of microprocessors and other circuits. Since 1983 he has been senior lecturer at the Dept. of Electron Devices (TUB-DED),full time and later part time. He has developed curricula and has given lessons on Programming, Semiconductor Theory,
Design of Integrated Circuits, Computer Algorithms and other topics. He was also a lecturer on postgraduate courses on Integrated Circuit Design. Since 1990 he took part in more TEMPUS and other European projects (BARMINT, PROFIT etc.). He spent several months at major European universities like Darmstadt (1991) , Lyngby (1993), Grenoble (1994, 1995) as supervisor of student activities and teacher on summer courses. In 1991 he was lecturer in an international summer course in Darmstadt where he
gave lessons on usage of Cadence and Solo 1400. >From 1990 to 1996 he was Chief Engineer at Neuklides CAD-CAM Ltd. , a mechanical design company and took part in interesting mechanical CAD and medical projects. >From 1996 to 1997 he was Software Director at the Central European University. From 1997 to 2000 he was Deputy Director of Informatics at the Information Organization for all Soros Institutions in Hungary CEU, OSI, IMC etc.) Their main task was giving services for a net of
organizations with more than 1500 informatics users. Since 2000 he has worked for MicReD Ltd. His main field has been developing hardware and software tools and measurement technologies for thermal characterisation of semiconductor devices. He speaks English, German and Russian. He has published many technical papers in journals, and in conference/workshop proceedings.
Research activity
His recent fields of research include
developing hardware and software tools for thermal characterisation of semiconductor devices
developing measurement technologies for thermal characterisation of semiconductor devices
combined thermal and radiometric/photometric characterization of power LED-s
