Teljesítmény félvezető eszközök karakterizációja (Robert Bosch Kft.)
A jelentkező hallgató az alábbi témák közül választhat:
SiC MOSFET Zth measurement | Compare different heating & sensing modes for SiC MOSFET. Analyse measurement error, repeatability, etc. | BSc/MSc |
Test method of semiconductor TPS | TSP (temperature sensitive parameter) parameter and determination of its sensitivity | BSc |
Automation of measurement system | Design and implementation of automation of semiconductor measuring system | BSc/MSc |
Gate control system design | Design and implementation of semiconductor gate control system for switching behavior characterization | MSc |
Magnetic field study | Control quality of wire bonding in assenbled module with help of analysis of magnetic field distribution under short current impulse | MSc/PhD |
Témavezető: Sigér Imre Robert Bosch Kft.